About Me
Bishnu Prasad Das obtained the Ph.D. degree in electronics design and technology from Indian Institute of Science (IISc), Bangalore, India, in 2009. He was with Texas Instruments, Bangalore, India, under Texas Instruments University Program during his Ph.D. He is currently an assistant professor in the Department of Electronics and Communication Engineering, IIT, Roorkee.
During July 2012 to Dec 2013, he worked as a Post-Doctoral Researcher with the Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, USA, in the project entitled Trusted Integrated Circuit Design. During 2009 to 2012, he worked as a Post-Doctoral Researcher with Kyoto University, Kyoto, Japan, in the project entitled Dependable VLSI platform using robust fabrics. His current research interests include resilient circuit design, on-chip process variability measurement, design of sub-threshold, variation tolerant standard cell library and hardware security
Recent Publications
- J5. Bishnu Prasad Das and Hidetoshi Onodera, "Frequency-Independent Warning Detection Sequential for Dynamic Voltage and Frequency Scaling in ASICs," IEEE Transactions on Very Large Scale Integration Systems. (Accepted)
- J4. Bishnu Prasad Das and Hidetoshi Onodera, "On-chip Measurement of Rise/Fall Gate Delay Using Reconfigurable Ring Oscillator," IEEE Transactions on Circuits and Systems II, Vol. 61, No. 3, Mar 2014, pp. 183-187.
- J3. Bishnu Prasad Das and Hidetoshi Onodera, "Area-Efficient Reconfigurable-Array-Based Oscillator for Standard Cell Characterization," IET Circuits Devices Syst., Vol. 6, Iss. 6, pp. 429–436, Nov. 2012.
